11.1 A 512Gb 3b/cell flash memory on 64-word-line-layer BiCS technology

Ryuji Yamashita, Sagar Magia, Tsutomu Higuchi, Kazuhide Yoneya, Toshio Yamamura, Hiroyuki Mizukoshi, Shingo Zaitsu, Minoru Yamashita, Shunichi Toyama, Norihiro Kamae, Juan Lee, Shuo Chen, Jiawei Tao, William Mak, Xiaohua Zhang, Ying Yu, Yuko Utsunomiya, Yosuke Kato, Manabu Sakai, Masahide Matsumoto, Hardwell Chibvongodze, Naoki Ookuma, Hiroki Yabe, Subodh Taigor, Rangarao Samineni, Takuyo Kodama, Yoshihiko Kamata, Yuzuru Namai, Jonathan Huynh, Sung-En Wang, Yankang He, Trung Pham, Vivek Saraf, Akshay Petkar, Mitsuyuki Watanabe, Koichiro Hayashi, Prashant Swarnkar, Hitoshi Miwa, Aditya Pradhan, Sulagna Dey, Debasish Dwibedy, Thushara Xavier, Muralikrishna Balaga, Samiksha Agarwal, Swaroop Kulkarni, Zameer Papasaheb, Sahil Deora, Patrick Hong, Meiling Wei, Gopinath Balakrishnan, Takuya Ariki, Kapil Verma, Chang Hua Siau, Yingda Dong, Ching-Huang Lu, Toru Miwa, Farookh Moogat. 11.1 A 512Gb 3b/cell flash memory on 64-word-line-layer BiCS technology. In 2017 IEEE International Solid-State Circuits Conference, ISSCC 2017, San Francisco, CA, USA, February 5-9, 2017. pages 196-197, IEEE, 2017. [doi]

Abstract

Abstract is missing.