A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution

Hiroshi Yamazaki, Motohiro Wakazono, Toshinori Hosokawa, Masayoshi Yoshimura. A Test Compaction Oriented Don't Care Identification Method Based on X-bit Distribution. IEICE Transactions, 96-D(9):1994-2002, 2013. [doi]

Abstract

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