A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments

Aibin Yan, Aoran Cao, Zhengzheng Fan, Zhelong Xu, Tianming Ni, Patrick Girard 0001, Xiaoqing Wen. A 4NU-Recoverable and HIS-Insensitive Latch Design for Highly Robust Computing in Harsh Radiation Environments. In Yiran Chen, Victor V. Zhirnov, Avesta Sasan, Ioannis Savidis, editors, GLSVLSI '21: Great Lakes Symposium on VLSI 2021, Virtual Event, USA, June 22-25, 2021. pages 301-306, ACM, 2021. [doi]

Abstract

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