Optimize SPL test cases with adaptive simulated annealing genetic algorithm

Liu Yan, Wenxin Hu, Longzhe Han. Optimize SPL test cases with adaptive simulated annealing genetic algorithm. In Proceedings of the ACM Turing Celebration Conference - China, ACM TUR-C 2019, Chengdu, China, May 17-19, 2019. ACM, 2019. [doi]

Abstract

Abstract is missing.