Aibin Yan, Shukai Song, Jixiang Zhang 0007, Jie Cui 0004, Zhengfeng Huang, Tianming Ni, Xiaoqing Wen, Patrick Girard 0001. Cost-Optimized and Robust Latch Hardened against Quadruple Node Upsets for Nanoscale CMOS. In IEEE International Test Conference in Asia, ITC-Asia 2022, Taipei, Taiwan, August 24-26, 2022. pages 73-78, IEEE, 2022. [doi]
Abstract is missing.