A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge

B. P. Yan, Y. F. Yang, C. C. Hsu, H. B. Lo, E. S. Yang. A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge. Microelectronics Reliability, 41(12):1959-1963, 2001. [doi]

Abstract

Abstract is missing.