Jie Yang, Luigi Capodieci, Dennis Sylvester. Advanced timing analysis based on post-OPC extraction of critical dimensions. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 359-364, ACM, 2005. [doi]
Abstract is missing.