Lin Yang, Junjie Chen, Zan Wang, Weijing Wang, Jiajun Jiang, Xuyuan Dong, Wenbin Zhang. Semi-supervised Log-based Anomaly Detection via Probabilistic Label Estimation. In 43rd IEEE/ACM International Conference on Software Engineering, ICSE 2021, Madrid, Spain, 22-30 May 2021. pages 1448-1460, IEEE, 2021. [doi]
Abstract is missing.