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Optimization of Built-In Self-Test test chain configuration in 2.5D Integrated Circuits Using Constrained Multi-Objective Evolutionary Algorithm

Zhe Yang, Libao Deng, Chunlei Li, Lili Zhang. Optimization of Built-In Self-Test test chain configuration in 2.5D Integrated Circuits Using Constrained Multi-Objective Evolutionary Algorithm. Eng. Appl. of AI, 143:109876, 2025. [doi]

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