Fu-Liang Yang, Jiunn-Ren Hwang, Yiming Li. Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 691-694, IEEE, 2006. [doi]
Abstract is missing.