Adaptive admittance-based conductor meshing for interconnect analysis

Ya-Chi Yang, Cheng-Kok Koh, Venkataramanan Balakrishnan. Adaptive admittance-based conductor meshing for interconnect analysis. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 509-514, IEEE, 2006. [doi]

Abstract

Abstract is missing.