Random pattern generation for post-silicon validation of DDR3 SDRAM

Hao-Yu Yang, Shih-Hua Kuo, Tzu-Hsuan Huang, Chi-Hung Chen, Chris Lin, Mango Chia-Tso Chao. Random pattern generation for post-silicon validation of DDR3 SDRAM. In 33rd IEEE VLSI Test Symposium, VTS 2015, Napa, CA, USA, April 27-29, 2015. pages 1-6, IEEE, 2015. [doi]

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