Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy

J. Yang, J. J. Kopanski, A. Postula, M. Bialkowski. Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy. Microelectronics Reliability, 45(5-6):887-890, 2005. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.