Wenfei Yang, Bin Liu, Nenghai Yu. Key-Region Representation Learning for Anomaly Detection. In Yao Zhao, Xiangwei Kong, David Taubman, editors, Image and Graphics - 9th International Conference, ICIG 2017, Shanghai, China, September 13-15, 2017, Revised Selected Papers, Part I. Volume 10666 of Lecture Notes in Computer Science, pages 687-697, Springer, 2017. [doi]
Abstract is missing.