Testing Methodologies for Embedded Systems and Systems-on-Chip

Laurence Tianruo Yang, Jon C. Muzio. Testing Methodologies for Embedded Systems and Systems-on-Chip. In Zhaohui Wu, Chun Chen, Minyi Guo, Jiajun Bu, editors, Embedded Software and Systems, First International Conference, ICESS 2004, Hangzhou, China, December 9-10, 2004, Revised Selected Papers. Volume 3605 of Lecture Notes in Computer Science, pages 15-24, Springer, 2004. [doi]

Abstract

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