Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process

Yiming Yang, Jianxin Peng, C. S. Cai, Yadong Zhou, Lei Wang, Jianren Zhang. Time-dependent reliability assessment of aging structures considering stochastic resistance degradation process. Rel. Eng. & Sys. Safety, 217:108105, 2022. [doi]

Abstract

Abstract is missing.