Detecting multi-layer layout hotspots with adaptive squish patterns

Haoyu Yang, Piyush Pathak, Frank Gennari, Ya-Chieh Lai, Bei Yu. Detecting multi-layer layout hotspots with adaptive squish patterns. In Toshiyuki Shibuya, editor, Proceedings of the 24th Asia and South Pacific Design Automation Conference, ASPDAC 2019, Tokyo, Japan, January 21-24, 2019. pages 299-304, ACM, 2019. [doi]

Abstract

Abstract is missing.