Danfeng Yang, Yuzhu Qin, Zhimin Huang, Yue Lu. Off-line Signature Verification Based on Combination of Modified Direction and Microstructure Features. In Tai-Hoon Kim, Hojjat Adeli, Carlos Ramos, Byeong Ho Kang, editors, Signal Processing, Image Processing and Pattern Recognition - International Conference, SIP 2011, Held as Part of the Future Generation Information Technology Conference FGIT 2011, in Conjunction with GDC 2011, Jeju Island, Korea, December 8-10, 2011. Proceedings. Volume 260 of Communications in Computer and Information Science, pages 270-279, Springer, 2011. [doi]
Abstract is missing.