Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning - researchr publication

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YuanFu Yang, Min Sun. Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 2313-2322, IEEE, 2022. [doi]

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