Improved Trace Buffer Observation via Selective Data Capture Using 2-D Compaction for Post-Silicon Debug

Joon-Sung Yang, Nur A. Touba. Improved Trace Buffer Observation via Selective Data Capture Using 2-D Compaction for Post-Silicon Debug. IEEE Trans. VLSI Syst., 21(2):320-328, 2013. [doi]

Abstract

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