Chun Yang, Lujing Tao, Jian Zhang, Xingtai Gui, Jiyang Zhang, Jianxiao Zou, Shicai Fan. A Fault Detection Method based on the Deep Extended PCA - SVM in Industrial Processes. In 2021 American Control Conference, ACC 2021, New Orleans, LA, USA, May 25-28, 2021. pages 3620-3625, IEEE, 2021. [doi]
Abstract is missing.