Profiting from IoT: The key is very-large-scale happiness integration

Kazuo Yano, Tomoaki Akitomi, Koji Ara, Jun-ichiro Watanabe, Satomi Tsuji, Nobuo Sato, Miki Hayakawa, Norihiko Moriwaki. Profiting from IoT: The key is very-large-scale happiness integration. In Symposium on VLSI Circuits, VLSIC 2015, Kyoto, Japan, June 17-19, 2015. pages 24, IEEE, 2015. [doi]

Abstract

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