Kosala Yapabandara, Vahid Mirkhani, Shiqiang Wang, Min P. Khanal, Sunil Uprety, Tamara Isaacs-Smith, Michael C. Hamilton, Minseo Park. Proton-induced displacement damage in ZnO thin film transistors: Impact of damage location. Microelectronics Reliability, 91:262-268, 2018. [doi]
Abstract is missing.