Isra Yaqoob, Nikta Pournoori, Jarkko Tolvanen, Toni Björninen, Jari Juuti, Leena Ukkonen. Functional Reliability Analysis of Self-Healing Passive UHF RFID Tag Under Mechanical Damage: Cutting and Stretching Effects. In IEEE International Conference on RFID Technology and Applications, RFID-TA 2025, Valence, France, October 28-31, 2025. pages 1-4, IEEE, 2025. [doi]
Abstract is missing.