Activation of logic encrypted chips: Pre-test or post-test?

Muhammad Yasin, Samah Mohamed Saeed, Jeyavijayan Rajendran, Ozgur Sinanoglu. Activation of logic encrypted chips: Pre-test or post-test?. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 139-144, IEEE, 2016. [doi]