Leonid Yavits, Lois Orosa 0001, Suyash Mahar, João Dinis Ferreira, Mattan Erez, Ran Ginosar, Onur Mutlu. WoLFRaM: Enhancing Wear-Leveling and Fault Tolerance in Resistive Memories using Programmable Address Decoders. In 38th IEEE International Conference on Computer Design, ICCD 2020, Hartford, CT, USA, October 18-21, 2020. pages 187-196, IEEE, 2020. [doi]
Abstract is missing.