Jing Ye, Yu Huang 0005, Yu Hu, Wu-Tung Cheng, Ruifeng Guo, Liyang Lai, Ting-Pu Tai, Xiaowei Li 0001, Wei-pin Changchien, Daw-Ming Lee, Ji-Jan Chen, Sandeep C. Eruvathi, Kartik K. Kumara, Charles C. C. Liu, Sam Pan. Diagnosis and Layout Aware (DLA) scan chain stitching. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-10, IEEE Computer Society, 2013. [doi]
Abstract is missing.