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Ran Ye, Xiaolong Cai, Chenglin Du, Haijun Liu, Yu Zhang, Xiangyang Duan, Jie-Jie Zhu. An Overview on Analyses and Suppression Methods of Trapping Effects in AlGaN/GaN HEMTs. IEEE Access, 10:21759-21773, 2022. [doi]
Abstract is missing.