Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection

Yunfan Ye, Renjiao Yi, Zhirui Gao, Zhiping Cai, Kai Xu 0004. Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection. IEEE Transactions on Image Processing, 32:4199-4211, 2023. [doi]

Abstract

Abstract is missing.