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Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection

Yunfan Ye, Renjiao Yi, Zhirui Gao, Zhiping Cai, Kai Xu 0004. Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection. IEEE Transactions on Image Processing, 32:4199-4211, 2023. [doi]

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Yunfan Ye

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Renjiao Yi

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Zhirui Gao

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Zhiping Cai

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Kai Xu 0004

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