Yunfan Ye, Renjiao Yi, Zhirui Gao, Zhiping Cai, Kai Xu 0004. Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection. IEEE Transactions on Image Processing, 32:4199-4211, 2023. [doi]
@article{YeYGCX23,
title = {Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection},
author = {Yunfan Ye and Renjiao Yi and Zhirui Gao and Zhiping Cai and Kai Xu 0004},
year = {2023},
doi = {10.1109/TIP.2023.3289296},
url = {https://doi.org/10.1109/TIP.2023.3289296},
researchr = {https://researchr.org/publication/YeYGCX23},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Image Processing},
volume = {32},
pages = {4199-4211},
}