Venkat Yellapragada, Suresh Raman, Banadappa Shivaray, Luc Romain, Benoit Nadeau-Dostie, Martin Keim, Jean-Francois Cote, Albert Au, Giri Podichetty, Ashok Anbalan. Implementing Design-for-Test Within a Tile-Based Design Methodology - Challenges and Solutions. In IEEE International Test Conference in Asia, ITC-Asia 2018, Harbin, China, August 15-17, 2018. pages 43-48, IEEE, 2018. [doi]
Abstract is missing.