Anand Yeolekar, Divyesh Unadkat, Vivek Agarwal, Shrawan Kumar, R. Venkatesh. Scaling Model Checking for Test Generation Using Dynamic Inference. In 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation, Luxembourg, Luxembourg, March 18-22, 2013. pages 184-191, IEEE, 2013. [doi]
Abstract is missing.