Deep-IRT: Make Deep Learning Based Knowledge Tracing Explainable Using Item Response Theory

Chun-Kit Yeung. Deep-IRT: Make Deep Learning Based Knowledge Tracing Explainable Using Item Response Theory. In Michel C. Desmarais, Collin F. Lynch, Agathe Merceron, Roger Nkambou, editors, Proceedings of the 12th International Conference on Educational Data Mining, EDM 2019, Montréal, Canada, July 2-5, 2019. International Educational Data Mining Society (IEDMS), 2019. [doi]

Abstract

Abstract is missing.