T.-Y. Yew, Y. C. Huang, M.-H. Hsieh, W. Wang, Y. H. Lee. The impact of inverter-like transitions on device TDDB and ring oscillators. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 1, IEEE, 2015. [doi]
Abstract is missing.