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Investigation of layer interface model of multi-layer structure using semi-analytical and FEM analysis for eddy current pulsed thermography

Qiuji Yi, Guiyun Tian, Houssem Chebbi, Denis Prémel. Investigation of layer interface model of multi-layer structure using semi-analytical and FEM analysis for eddy current pulsed thermography. In 2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020, Dubrovnik, Croatia, May 25-28, 2020. pages 1-5, IEEE, 2020. [doi]

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