Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor. Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
Abstract is missing.