Mahmut Yilmaz, Baosheng Wang, Jayalakshmi Rajaraman, Tom Olsen, Kanwaldeep Sobti, Dwight Elvey, Jeff Fitzgerald, Grady Giles, Wei-Yu Chen. The scan-DFT features of AMD's next-generation microprocessor core. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 39-48, IEEE, 2010. [doi]
Abstract is missing.