Zhang Ying, Wu Ning, Ke Xiazhi, Ge Fen. A Coverage-Driven Verification Platform for Evaluating NoC Performance and Test Structure. In Leonard Barolli, Tomoya Enokido, Fatos Xhafa, Makoto Takizawa, editors, 26th International Conference on Advanced Information Networking and Applications Workshops, WAINA 2012, Fukuoka, Japan, March 26-29, 2012. pages 261-265, IEEE, 2012. [doi]
Abstract is missing.