Tomokazu Yoneda, Hideo Fujiwara. Design for Consecutive Transparency of Cores in System-on-a-Chip. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 287-292, IEEE Computer Society, 2003. [doi]
Abstract is missing.