Dependable routing in multi-chip NoC platforms for automotive applications

Tomohiro Yoneda, Masashi Imai. Dependable routing in multi-chip NoC platforms for automotive applications. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 217-224, IEEE Computer Society, 2012. [doi]

Abstract

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