Tomokazu Yoneda, Tetsuo Uchiyama, Hideo Fujiwara. Area and Time Co-Optimization for System-on-a-Chip based on Consecutive Testability. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 415-422, IEEE Computer Society, 2003. [doi]
Abstract is missing.