Jong-Hyeok Yoon, Muya Chang, Win-San Khwa, Yu-Der Chih, Meng-Fan Chang, Arijit Raychowdhury. A 40nm 100Kb 118.44TOPS/W Ternary-weight Computein-Memory RRAM Macro with Voltage-sensing Read and Write Verification for reliable multi-bit RRAM operation. In IEEE Custom Integrated Circuits Conference, CICC 2021, Austin, TX, USA, April 25-30, 2021. pages 1-2, IEEE, 2021. [doi]
Abstract is missing.