Shuhei Yoshida, Go Matsukawa, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto. An soft error propagation analysis considering logical masking effect on re-convergent path. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 13-16, IEEE, 2016. [doi]
Abstract is missing.