An soft error propagation analysis considering logical masking effect on re-convergent path

Shuhei Yoshida, Go Matsukawa, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto. An soft error propagation analysis considering logical masking effect on re-convergent path. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 13-16, IEEE, 2016. [doi]

@inproceedings{YoshidaMIKY16,
  title = {An soft error propagation analysis considering logical masking effect on re-convergent path},
  author = {Shuhei Yoshida and Go Matsukawa and Shintaro Izumi and Hiroshi Kawaguchi and Masahiko Yoshimoto},
  year = {2016},
  doi = {10.1109/IOLTS.2016.7604661},
  url = {http://dx.doi.org/10.1109/IOLTS.2016.7604661},
  researchr = {https://researchr.org/publication/YoshidaMIKY16},
  cites = {0},
  citedby = {0},
  pages = {13-16},
  booktitle = {22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016},
  publisher = {IEEE},
  isbn = {978-1-5090-1507-8},
}