Yoichi Yoshida, Koichi Nose, Yoshihiro Nakagawa, Koichiro Noguchi, Yasuhiro Morita, Masamoto Tago, Masayuki Mizuno, Tadahiro Kuroda. An Inductive-Coupling DC Voltage Transceiver for Highly Parallel Wafer-Level Testing. J. Solid-State Circuits, 45(10):2057-2065, 2010. [doi]
Abstract is missing.