A Synthesis Method to Alleviate Over-Testing of Delay Faults Based on RTL Don t Care Path Identification

Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara. A Synthesis Method to Alleviate Over-Testing of Delay Faults Based on RTL Don t Care Path Identification. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 71-76, IEEE Computer Society, 2009. [doi]

Abstract

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