Bit-Error and Soft-Error Resilient 7T/14T SRAM with 150-nm FD-SOI Process

Shusuke Yoshimoto, Takuro Amashita, Shunsuke Okumura, Koji Nii, Masahiko Yoshimoto, Hiroshi Kawaguchi. Bit-Error and Soft-Error Resilient 7T/14T SRAM with 150-nm FD-SOI Process. IEICE Transactions, 95-A(8):1359-1365, 2012. [doi]

Abstract

Abstract is missing.