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Shusuke Yoshimoto, Takuro Amashita, Shunsuke Okumura, Koji Nii, Masahiko Yoshimoto, Hiroshi Kawaguchi. Bit-Error and Soft-Error Resilient 7T/14T SRAM with 150-nm FD-SOI Process. IEICE Transactions, 95-A(8):1359-1365, 2012. [doi]
Abstract is missing.