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Shusuke Yoshimoto, Shunsuke Okumura, Koji Nii, Hiroshi Kawaguchi, Masahiko Yoshimoto. Multiple-Cell-Upset Tolerant 6T SRAM Using NMOS-Centered Cell Layout. IEICE Transactions, 96-A(7):1579-1585, 2013. [doi]
Abstract is missing.