Diagnosis technique for Clustered Multiple Transition Delay Faults

Yan-Shen You, Chih-Yan Liu, Mu-Ting Wu, Po-Wei Chen, James Chien-Mo Li. Diagnosis technique for Clustered Multiple Transition Delay Faults. In IEEE International Test Conference in Asia, ITC-Asia 2020, Taipei, Taiwan, September 23-25, 2020. pages 53-58, IEEE, 2020. [doi]

Abstract

Abstract is missing.